A specialized type of X-ray fluorescence spectrometry which satisfies the particular requirements of certain artifacts. The principle is the same as for X-ray fluorescence spectrometry, but an instrument directs a highly focused X-ray beam at a desired point(s) on the sample surface. Secondary X-rays emitted from this point are then directed to a detector and analyzed. The spectrometer is outside the artifact, in contrast to standard X-ray spectrometry where the specimen is inside the spectrometer. The advantage that the X-ray milliprobe has over the electron probe microanalyzer is the ease with which samples can be prepared. The technique has flexibility and the ability to analyze microscopic areas.